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OestVast10

Abstract:

During the last decades, electronic textual information has become
the world’s largest and most important information source avail-
able. People have added a variety of daily newspapers, books, sci-
entific and governmental publications, blogs and private messages
to this wellspring of endless information and knowledge. Since nei-
ther the existing nor the new information can be read in its entirety,
computers are used to extract and visualize meaningful or interest-
ing topics and documents from this huge information clutter.
In this paper, we extend, improve and combine existing individ-
ual approaches into an overall framework that supports topologi-
cal analysis of high dimensional document point clouds given by
the well-known tf-idf document-term weighting method. We show
that traditional distance-based approaches fail in very high dimen-
sional spaces, and we describe an improved two-stage method for
topology-based projections from the original high dimensional in-
formation space to both two dimensional (2-D) and three dimen-
sional (3-D) visualizations. To show the accuracy and usability of
this framework, we compare it to methods introduced recently and
apply it to complex document and patent collections.

Type: Inproceedings

Author: Patrick Oesterling and Gerik Scheuermann and Sven Teresniak and Gerhard Heyer and S. Koch and Thomas Ertl and G. H. Weber
Title: Two-stage Framework for a Topology-Based Projection and Visualization of Classified Document Collections
Booktitle: IEEE Conference on Visual Analytics Science and Technology (IEEE VAST)
Year: 2010
Publisher:IEEE Computer Society
Address:
@INPROCEEDINGS{OestVast10,
AUTHOR = {Patrick Oesterling and Gerik Scheuermann and Sven Teresniak and Gerhard Heyer and S. Koch and Thomas Ertl and G. H. Weber},
TITLE = {Two-stage Framework for a Topology-Based Projection and Visualization of Classified Document Collections},
BOOKTITLE = {IEEE Conference on Visual Analytics Science and Technology (IEEE VAST)},
YEAR = {2010},
PUBLISHER = {IEEE Computer Society}
}